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Jeol JSM-6400F Scanning Microscope
Jeol JSM-6400F Scanning Microscope
Jeol JSM-6400F Scanning Microscope

Jeol JSM-6400F Scanning Microscope

$ 13200

Availability: 100 in stock
  • Restocking Fee: No
  • Model: JSM-6400F
  • Equipment Type: SEM
  • Return shipping will be paid by: Buyer
  • Condition: Being Sold As-Is / Where Is.
  • Refund will be given as: Money Back
  • All returns accepted: Returns Accepted
  • Item must be returned within: 14 Days
  • Brand: Jeol

    Description

    Jeol JSM-6400F(ID# 4488) Scanning Microscope consisting of:
    - Resolution: 1.5 nm at 30 kV and at 8mm WD
    - Magnification: 10X to 500 000X
    - Probe current: 10-12 to 10-10 A
    - Electron gun: Cold-cathode field emission
    - Detectors: Scintillator/photomultiplier
    - GW Electronic System 47 backscattered detector
    - Accelerating Voltage: 500V to 30kV
    - Specimen Stage:    Type: Fully Eucentric goniometer stage
    - Movements: X = 100mm, Y = 110mm, Z = 34mm
    - Tilt: -5˚to 60˚
    - Rotation: 360˚ endless
    - Specimen exchange:  By airlock: Up to 150mm dia. Specimen holders
    This tool is available for inspection upon appointment at ClassOne's facility at 5302 Snapfinger Woods Dr, Decatur, GA 30035. Please see our website for any questions or interest.